{"title":"Calibration \u0026 Test Specimens","description":"\u003cp\u003e\u003cspan\u003eDiscover Agar Scientific calibration standards and test specimens for SEM calibration, instrument verification and electron microscopy. Browse reference materials designed to support accurate imaging, measurement and routine microscope performance checks.\u003c\/span\u003e\u003c\/p\u003e","products":[{"product_id":"agar-gold-on-carbon-sem-resolution","title":"AGS168 – Gold-On-Carbon SEM Resolution Test Specimen on Pin Stub","description":"Resolution test specimen with a particle size range from approximately 5 - 150nm. Gold on Carbon Specimen on Pin Stub 12.5 mm dia., 3.2 x 8 mm pin","brand":"Gloor Instruments AG","offers":[{"title":"Default Title","offer_id":54297164120449,"sku":"AGS168","price":95.0,"currency_code":"CHF","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0643\/5281\/3284\/files\/20220602_prophysics_foto_agar_scientific_ags168.jpg?v=1721118700"},{"product_id":"agar-universal-tin-carbon-specimen","title":"AGS1937 – Universal Tin on Carbon Specimen on Pin Stub","description":"Universal Tin on Carbon Test Specimen on Pin Stub 12.5 mm dia., 3.2 x 8 mm pin\u003cbr\u003e\r\u003cbr\u003e\rThis tin on carbon test specimen has a very wide size range of tin spheres which give high contrast when imaged in the SEM. The largest spheres can be used for basic column alignment at low magnification; intermediate sized spheres are useful for monitoring image shift when changing operating parameters or resolution checking at low kV; and the smallest spheres can be used for resolution checking and astigmatism correction at the very highest magnifications.","brand":"Gloor Instruments AG","offers":[{"title":"Default Title","offer_id":54297164153217,"sku":"AGS1937","price":190.0,"currency_code":"CHF","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0643\/5281\/3284\/files\/20220602_prophysics_foto_agar_scientific_ags1937.jpg?v=1721118704"},{"product_id":"ags220-t-cdms-cr-au-525µm-2mm-1µm-traceable-on-pin-stub-12-5-mm-dia","title":"AGS220-T – CDMS Cr\/Au 525µm 2mm-1µm Traceable on Pin Stub 12.5 mm dia.,","description":"Critical Dimension Standards, 2.0mm to 1μm, Traceable\u003cbr\u003e\r\u003cbr\u003e\rEconomically priced, fully-featured compliant Critical Dimension Standards for calibration over a wide measurement range.\u003cbr\u003e\r\u003cbr\u003e\r2.0mm to 1μm for a magnification range from 10x - 20,000x and is ideal for desktop SEMs and low to medium magnification applications. It has a unique serial identification number and is NIST traceable:\u003cbr\u003e\r\u003cbr\u003e\rAvailable with Global Certificate of Calibration using the average data measured for each production wafer\u003cbr\u003e\rAlso available with an Individual Die Certificate of Calibration for higher accuracy\u003cbr\u003e\rManufactured on an ultra-flat silicon substrate with a precise 60nm chromium deposition for the features up to 5µm and a combination of 50nm gold over 20nm chromium for the features sizes from 2µm to 100nm.\u003cbr\u003e\r\u003cbr\u003e\rThe Cr and Au\/Cr on Si provide excellent contrast both in SE and BSE imaging mode. The features are easier to determine than on etched Si standards. Since the silicon substrate, the chromium and the chromium\/gold features are all conductive there are no charging issues with this calibration standard. Due to its sturdy construction, the CDMS standard can be cleaned using gentle plasma cleaning. ","brand":"Gloor Instruments AG","offers":[{"title":"Default Title","offer_id":54340473520513,"sku":"AGS220-T","price":83.0,"currency_code":"CHF","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0643\/5281\/3284\/files\/20250526_gloor_webshop_ags220_t.png?v=1748251967"},{"product_id":"ags221-t-cdms-chrome-and-gold-525µm-2-0mm-to-100nm-traceable","title":"AGS221-T – CDMS Chrome and gold 525µm 2.0mm to 100nm Traceable","description":"Economically priced, fully-featured compliant Critical Dimension Standards for calibration over a wide measurement range.\u003cbr\u003e\r\u003cbr\u003e\r2.0mm to 100nm for a magnification range up to 10 - 200,000x; for all SEM and most FESEM applications.\u003cbr\u003e\r\u003cbr\u003e\rIt has a unique serial identification number and is NIST traceable:\u003cbr\u003e\r\u003cbr\u003e\rAvailable with Global Certificate of Calibration using the average data measured for each production wafer\u003cbr\u003e\rAlso available with an Individual Die Certificate of Calibration for higher accuracy\u003cbr\u003e\r\u003cbr\u003e\rManufactured on an ultra-flat silicon substrate with a precise 60nm chromium deposition for the features up to 5µm and a combination of 50nm gold over 20nm chromium for the features sizes from 2µm to 100nm.\u003cbr\u003e\r\u003cbr\u003e\rThe Cr and Au\/Cr on Si provide excellent contrast both in SE and BSE imaging mode. The features are easier to determine than on etched Si standards. Since the silicon substrate, the chromium and the chromium\/gold features are all conductive there are no charging issues with this calibration standard. Due to its sturdy construction, the CDMS standard can be cleaned using gentle plasma cleaning. \u003cbr\u003e\r\u003cbr\u003e\rThe smaller features are nested for easy navigation and quick calibration. The accuracy of the features is 0.3% or better. The actual size of the standard is 2.5 x 2.5mm with a thickness of 525µm ±20µm. There is no coating on the Si surface. Each CDMS calibration standard has a unique identification number.","brand":"Gloor Instruments AG","offers":[{"title":"Default Title","offer_id":54340474503553,"sku":"AGS221-T","price":559.5,"currency_code":"CHF","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0643\/5281\/3284\/files\/20250526_gloor_webshop_ags221_t.png?v=1748252276"},{"product_id":"bse-reference-nickel-copper","title":"AGS1950 – BSE Reference - Nickel\/Copper","description":"Reference specimens for backscattered electron detection systems. - Nickel\/Copper\u003cbr\u003e\r\u003cbr\u003e\rAn electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z) across the specimen. \u003cbr\u003e\r\u003cbr\u003e\rThe reference specimens consists of two high purity elements that have an atomic number difference of 1. It is in the form of two wires embedded side by side in a contrasting matrix.\u003cbr\u003e\r\u003cbr\u003e\rThe specimens are available as a single mount either 3mm or 5mm diameter brass or aluminium tubes or alternatively can be incorporated into a block of standards.","brand":"Gloor Instruments AG","offers":[{"title":"Default Title","offer_id":54340639621505,"sku":"AGS1950","price":479.5,"currency_code":"CHF","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0643\/5281\/3284\/files\/20250526_gloor_webshop_ags1950.png?v=1748260038"},{"product_id":"faraday-cup","title":"AGS1929 – Faraday cup","description":"A Faraday Cup is used for measuring the beam current at the specimen plane. The beam of electrons is focused inside the hole by increasing magnification so that when the hole fills the screen all the electrons are trapped and a true measure of current is achieved. The hole size of the Faraday Cup is 150μm.\u003cbr\u003e\r\u003cbr\u003e\rSupplied mounted in a 12.5mm pin stub.","brand":"Gloor Instruments AG","offers":[{"title":"Default Title","offer_id":54340640080257,"sku":"AGS1929","price":405.5,"currency_code":"CHF","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0643\/5281\/3284\/files\/20220602_prophysics_foto_agar_scientific_ags1929.jpg?v=1748260107"}],"url":"https:\/\/gloorinstruments.shop\/collections\/agar-scientific-calibration-test-specimens.oembed","provider":"Gloor Instruments AG","version":"1.0","type":"link"}