AGS220-T – CDMS Cr/Au 525µm 2mm-1µm Traceable on Pin Stub 12.5 mm dia.,
AGS220-T – CDMS Cr/Au 525µm 2mm-1µm Traceable on Pin Stub 12.5 mm dia.,
Regular price
CHF 80.00
Regular price
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CHF 80.00
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Critical Dimension Standards, 2.0mm to 1μm, Traceable
Economically priced, fully-featured compliant Critical Dimension Standards for calibration over a wide measurement range.
2.0mm to 1μm for a magnification range from 10x - 20,000x and is ideal for desktop SEMs and low to medium magnification applications. It has a unique serial identification number and is NIST traceable:
Available with Global Certificate of Calibration using the average data measured for each production wafer
Also available with an Individual Die Certificate of Calibration for higher accuracy
Manufactured on an ultra-flat silicon substrate with a precise 60nm chromium deposition for the features up to 5µm and a combination of 50nm gold over 20nm chromium for the features sizes from 2µm to 100nm.
The Cr and Au/Cr on Si provide excellent contrast both in SE and BSE imaging mode. The features are easier to determine than on etched Si standards. Since the silicon substrate, the chromium and the chromium/gold features are all conductive there are no charging issues with this calibration standard. Due to its sturdy construction, the CDMS standard can be cleaned using gentle plasma cleaning.
Economically priced, fully-featured compliant Critical Dimension Standards for calibration over a wide measurement range.
2.0mm to 1μm for a magnification range from 10x - 20,000x and is ideal for desktop SEMs and low to medium magnification applications. It has a unique serial identification number and is NIST traceable:
Available with Global Certificate of Calibration using the average data measured for each production wafer
Also available with an Individual Die Certificate of Calibration for higher accuracy
Manufactured on an ultra-flat silicon substrate with a precise 60nm chromium deposition for the features up to 5µm and a combination of 50nm gold over 20nm chromium for the features sizes from 2µm to 100nm.
The Cr and Au/Cr on Si provide excellent contrast both in SE and BSE imaging mode. The features are easier to determine than on etched Si standards. Since the silicon substrate, the chromium and the chromium/gold features are all conductive there are no charging issues with this calibration standard. Due to its sturdy construction, the CDMS standard can be cleaned using gentle plasma cleaning.
Shipping & Returns
Shipping & Returns
Please be aware that standard shipping may take between 4–6 weeks, depending on product availability. We will provide tracking details as soon as your order is dispatched.
