AGS1950 – BSE Reference - Nickel/Copper
AGS1950 – BSE Reference - Nickel/Copper
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Reference specimens for backscattered electron detection systems. - Nickel/Copper
An electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z) across the specimen.
The reference specimens consists of two high purity elements that have an atomic number difference of 1. It is in the form of two wires embedded side by side in a contrasting matrix.
The specimens are available as a single mount either 3mm or 5mm diameter brass or aluminium tubes or alternatively can be incorporated into a block of standards.
An electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z) across the specimen.
The reference specimens consists of two high purity elements that have an atomic number difference of 1. It is in the form of two wires embedded side by side in a contrasting matrix.
The specimens are available as a single mount either 3mm or 5mm diameter brass or aluminium tubes or alternatively can be incorporated into a block of standards.
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